The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble
surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the
determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity
and contactlessness of measurement and does not require special surface treatment before measurement.
Tester operation and measurement data processing are carried out by a PC.
* Application : Silicon Ingots
[ Specification ]
Measured resistivity range, Ohm¡¤cm
0.001-0.5 (¡¾ 3%)
Measurement duration, sec
Minimal Diameter of measured surface, mm2
30 x 30
Dimensions (without probe), mm
280 x 200 x 60
Device is equipped with a set of standard samples for calibration.